File:Nanoscope.jpg
Summary
This instrument performs <a href="https://en.wikipedia.org/wiki/atomic_force_microscopy" class="extiw" title="en:atomic force microscopy">atomic force microscopy</a> to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samples. (Pictured: Seth Darling, scientist in the Electronic & Magnetic Materials & Devices group.)
The <a href="https://en.wikipedia.org/wiki/Center_for_Nanoscale_Materials" class="extiw" title="en:Center for Nanoscale Materials">Center for Nanoscale Materials</a> at Argonne National Laboratory is a joint partnership between the U.S. Department of Energy (DOE) and the State of Illinois, as part of DOE's Nanoscale Science Research Center program.
Licensing
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File history
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 11:46, 7 January 2017 | | 4,288 × 2,848 (6.6 MB) | 127.0.0.1 (talk) | <p>This instrument performs <a href="https://en.wikipedia.org/wiki/atomic_force_microscopy" class="extiw" title="en:atomic force microscopy">atomic force microscopy</a> to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samples. (Pictured: Seth Darling, scientist in the Electronic & Magnetic Materials & Devices group.) </p> <p>The <a href="https://en.wikipedia.org/wiki/Center_for_Nanoscale_Materials" class="extiw" title="en:Center for Nanoscale Materials">Center for Nanoscale Materials</a> at Argonne National Laboratory is a joint partnership between the U.S. Department of Energy (DOE) and the State of Illinois, as part of DOE's Nanoscale Science Research Center program. </p> |
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